Software de pruebas para cama de pinchos
Fecha
2021-11-18
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Jaén: Universidad de Jaén
Resumen
Las placas de prueba para circuitos integrados (PCB test fixture), o “camas de pinchos”, como se
suelen denominar en el ámbito industrial, constituyen una herramienta esencial para comprobar el
buen funcionamiento de microcontroladores durante el proceso de su fabricación. Generalmente,
este proceso de prueba puede automatizarse por medio de diferentes soluciones software. En este
trabajo fin de grado, se propone el diseño e implementación de una herramienta software para la
programación de un microcontrolador y la automatización de los procesos de pruebas
semifuncionales sobre el mismo, optimizando dicho software para una máxima usabilidad y
eficiencia en su aplicación, medida como el número circuitos impresos testados en un determinado
espacio de tiempo.
Integrated circuit test boards, or "spike beds," as they are often referred to in industry, are an essential tool for checking the proper functioning of microcontrollers during the manufacturing process. Generally, this testing process can be automated using different software solutions. In this final degree project, the design and implementation of a software tool for programming a microcontroller and the automation of semi-functional testing processes on it is proposed, optimizing said software for maximum usability and efficiency in its application, measured as the number of printed circuits tested in a certain period of time.
Integrated circuit test boards, or "spike beds," as they are often referred to in industry, are an essential tool for checking the proper functioning of microcontrollers during the manufacturing process. Generally, this testing process can be automated using different software solutions. In this final degree project, the design and implementation of a software tool for programming a microcontroller and the automation of semi-functional testing processes on it is proposed, optimizing said software for maximum usability and efficiency in its application, measured as the number of printed circuits tested in a certain period of time.